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InShape(TM) predicts accurate silicon shapes, enabling designers to perform DFM hotspot detection of catastrophic failures. This model-based Design Manufacturability Checker utilizes nonlinear optical transformation algorithm to detect potential manufacturing failures during physical design. Compact models encapsulate all necessary RET, OPC, mask, etch, and lithography effects on both device and interconnect, predicting accurate contours for entire chip from drawn layout within hours.
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